Methods and Appartus for Data Analysis

Author(s): Buxton, P.M. | Martin, E.M. | Tabor, E.P. | Zalzala, A.M.S. |

Year: 2007

Citation: Patent number: 7225107 Issue date: May 29, 2007

Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.

Topics: Machine Learning,

PDF download

Cross References