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Author(s): Buxton, P.M. | Martin, E.M. | Tabor, E.P. | Zalzala, A.M.S. |
Year: 2007
Citation: Patent number: 7225107 Issue date: May 29, 2007
Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.
Topics:
Machine Learning,
